LAFON, F.; RAMANUJAN, A.; FERNANDEZ-LOPEZ, P. Black Box Model of Integrated Circuits for ESD Behavioral Simulation and Industrial Application Case. Advanced Electromagnetics, [S. l.], v. 4, n. 2, p. 26–37, 2015. DOI: 10.7716/aem.v4i2.279. Disponível em: http://aemjournal.metaconferences.org/index.php/AEM/article/view/279. Acesso em: 8 feb. 2025.