Lafon, F., A. Ramanujan, and P. Fernandez-Lopez. “Black Box Model of Integrated Circuits for ESD Behavioral Simulation and Industrial Application Case”. Advanced Electromagnetics 4, no. 2 (November 2, 2015): 26–37. Accessed February 8, 2025. http://aemjournal.metaconferences.org/index.php/AEM/article/view/279.