1.
Lafon F, Ramanujan A, Fernandez-Lopez P. Black Box Model of Integrated Circuits for ESD Behavioral Simulation and Industrial Application Case. AEM [Internet]. 2015 Nov. 2 [cited 2025 Feb. 8];4(2):26-37. Available from: http://aemjournal.metaconferences.org/index.php/AEM/article/view/279